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Integration scheme for 3D NAND with nonreplacement word line and its cell characteristics investigation.

Liu JiangChang Seok KangAshish PalEl Mehdi BaziziTomohiko KitajimaNancy FungGabriela AlvaAmy ChildBhaskar BhuyanTakehito KoshizawaSung-Kwan KangGill LeeDavid HwangBlessy AlexanderBuvna Ayyagari
Published in: IMW (2021)
Keyphrases
  • co occurrence
  • n gram
  • classification scheme
  • real time
  • neural network
  • data integration
  • database
  • image quality
  • word pairs