Wafer Map Defect Pattern Recognition using Imbalanced Datasets.
Theodoros TziolasTheodosis TheodosiouKonstantinos PapageorgiouAikaterini RaptiNikolaos DimitriouDimitrios TzovarasElpiniki PapageorgiouPublished in: IISA (2022)
Keyphrases
- imbalanced datasets
- cost sensitive learning
- learning from imbalanced data
- class distribution
- class imbalance
- imbalanced data
- cost sensitive
- sampling methods
- decision trees
- training dataset
- feature selection algorithms
- maximum a posteriori
- ensemble methods
- supervised learning
- multi class
- random forest
- random sampling
- support vector machine