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Prediction of dielectric reliability from I-V characteristics: Poole-Frenkel conduction mechanism leading to sqrt(E) model for silicon nitride MIM capacitor.
K.-H. Allers
Published in:
Microelectron. Reliab. (2004)
Keyphrases
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computational model
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cost function
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theoretical analysis
experimental data
formal model
probabilistic model
management system
parameter estimation
theoretical framework
learning mechanism
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