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and Yield Estimation for Nanoscale SRAMs.

Shourya GuptaBenton H. Calhoun
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2021)
Keyphrases
  • data mining
  • machine learning
  • search engine
  • special case
  • accurate estimation
  • genetic algorithm
  • image processing
  • wide range
  • estimation algorithm
  • estimation accuracy