Sign in
Reducing Temperature Induced Unreliability in Sub-Threshold Strong PUFs through Circuit Modeling.
Nimesh Shah
Sumon Kumar Bose
Chip-Hong Chang
Arindam Basu
Published in:
ISCAS (2020)
Keyphrases
</>
real time
control system
high speed
modeling language
transient response
database
information retrieval
image sequences
room temperature
threshold selection