CMOS scaling in the 0.1-µm, 1.X-volt regime for high-performance applications.
G. G. ShahidiJames D. WarnockJames ComfortStephen E. FischerPatricia A. McFarlandAlexandre AcovicTerry I. ChappellBarbara A. ChappellTak H. NingCarl J. AndersonRobert H. DennardJ. Y.-C. SunMichael R. PolcariBijan DavariPublished in: IBM J. Res. Dev. (1995)