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Universal machine learning framework for defect predictions in zinc blende semiconductors.
Arun Mannodi-Kanakkithodi
Xiaofeng Xiang
Laura Jacoby
Robert Biegaj
Scott T. Dunham
Daniel R. Gamelin
Maria K. Y. Chan
Published in:
Patterns (2022)
Keyphrases
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machine learning
decision trees
data mining
main contribution
computer vision
theoretical framework
genetic algorithm
image processing
pattern recognition
knowledge discovery
lightweight
machine learning algorithms