Sign in

Uniformity Pattern of Asymmetric Fractional Factorials.

Hong QinZhenghong WangKashinath Chatterjee
Published in: J. Syst. Sci. Complex. (2016)
Keyphrases
  • pattern matching
  • hurst exponent
  • wide range
  • database
  • databases
  • real world
  • information systems
  • image processing
  • information technology
  • pattern generation