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Coverage-biased Random Exploration of Models.

Marie-Claude GaudelAlain DeniseSandrine-Dominique GouraudRichard LassaigneJohan OudinetSylvain Peyronnet
Published in: Electron. Notes Theor. Comput. Sci. (2008)
Keyphrases
  • high quality
  • multiscale
  • model selection
  • data mining
  • machine learning
  • genetic algorithm
  • learning algorithm
  • graphical models
  • software development
  • learning models