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Resolving the Reliability Issues of Open Blocks for 3-D NAND Flash: Observations and Strategies.
Qiao Li
Min Ye
Yufei Cui
Tianyu Ren
Tei-Wei Kuo
Chun Jason Xue
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2022)
Keyphrases
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data sets
key issues
highly reliable
neural network
data mining
machine learning
artificial intelligence
information systems
knowledge base
multiresolution
data management
image compression
image quality