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A built-in testing scheme for ic memories by considering address decoder and cell array separately.

Hideo TamamotoHirotomo SakusabeYuichi Narita
Published in: Systems and Computers in Japan (1987)
Keyphrases
  • low complexity
  • multiview video coding
  • integrated circuit
  • decoding algorithm
  • error control
  • image compression
  • infrared
  • video coding
  • microscopy images
  • video coding scheme