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A Self Test Program Design Technique for Embedded DSP Cores.

Hani RizkChristos A. PapachristouFrancis G. Wolff
Published in: J. Electron. Test. (2006)
Keyphrases
  • embedded systems
  • design process
  • neural network
  • digital images
  • control program
  • real time
  • computer vision
  • signal processing
  • design patterns
  • experimental design
  • design space
  • digital signal processing