Login / Signup

TCAD simulation of radiation-induced leakage current in 1T1C SDRAM.

Hoang T. NguyenAxel RodriguezFrederic WrobelAlain MichezFrancoise BezerraNathalie ChatryBenjamin Vandevelde
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • real time
  • x ray
  • infrared
  • simulation model