Defects Localization in Images Using Deep Learning-Based Classification with CAM Output.
Rytis AugustauskasLukas ZabulisArunas LipnickasSimas JokubauskasPublished in: IDAACS (2023)
Keyphrases
- deep learning
- image classification
- unsupervised learning
- image database
- image features
- input image
- machine learning
- pattern recognition
- feature selection
- restricted boltzmann machine
- multiple images
- test images
- text classification
- image retrieval
- segmentation algorithm
- unsupervised feature learning
- feature space
- region of interest
- object recognition
- natural images
- segmentation method
- feature extraction
- image processing