Methods to improve digital MOS macromodel accuracy.

Jeong-Taek Kong David Overhauser

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1995)

Keyphrases

computational cost
high accuracy
preprocessing
significant improvement
information retrieval
information systems
image processing
image sequences
search algorithm
high dimensional
cross validation
roc curve
exhaustive search
estimation accuracy