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Capacity-Achieving Codes That Mitigate Intercell Interference and Charge Leakage in Flash Memories.

Yeow Meng CheeJohan ChrisnataHan Mao KiahSan LingTuan Thanh NguyenVan Khu Vu
Published in: IEEE Trans. Inf. Theory (2019)
Keyphrases
  • noise ratio
  • error correction
  • capacity expansion
  • charge coupled devices
  • multipath
  • foreseeable future
  • database
  • learning algorithm
  • associative memory