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Suppression of Current Collapse of High-Voltage AlGaN/GaN HFETs on Si Substrates by Utilizing a Graded Field-Plate Structure.

Tadayoshi DeguchiHideshi TomitaAtsushi KamadaManabu AraiKimiyoshi YamasakiTakashi Egawa
Published in: IEICE Trans. Electron. (2012)
Keyphrases
  • high voltage
  • future development
  • learning algorithm
  • dynamic programming
  • multi class