Patterns of Reliability: Assessing the Reproducibility and Integrity of DNA Methylation Measurement.

Karen Sugden Eilis J. Hannon Louise Arseneault Daniel W. Belsky David L. Corcoran Helen L. Fisher Renate M. Houts Radhika Kandaswamy Terrie E. Moffitt Richie Poulton Joseph A. Prinz Line J. H. Rasmussen Benjamin S. Williams Chloe C. Y. Wong Jonathan Mill Avshalom Caspi

Published in: Patterns (2020)

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