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Hot-electron effects on AlGaAs/InGaAs/GaAs PHEMTs under accelerated DC stresses.

Hou-Kuei HuangChou-Sern WangMau-Phon HoungYeong-Her Wang
Published in: Microelectron. Reliab. (2006)
Keyphrases
  • real time
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  • multiscale
  • field effect transistors