A Method for Storing Fail Bit Maps in Burn-in Memory Testers.
Atsumu IsenoYukihiro IguchiPublished in: DELTA (2002)
Keyphrases
- high accuracy
- high precision
- preprocessing
- objective function
- input image
- d objects
- classification method
- synthetic data
- detection method
- support vector machine svm
- theoretical analysis
- computationally efficient
- mutual information
- decision trees
- support vector machine
- probabilistic model
- computational cost
- mobile robot
- dynamic programming
- cost function
- multiscale