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Introduction to Special Issue SAP 2015.

Scott KuhlRafal MantiukBetsy Sanders
Published in: ACM Trans. Appl. Percept. (2015)
Keyphrases
  • special issue
  • ai edam
  • ecml pkdd
  • international journal
  • applied intelligence
  • special section
  • data mining
  • case study
  • decision support system