Vector corrected on-wafer measurements of noise temperature.
Mark H. WeatherspoonLawrence P. DunleavyPublished in: IEEE Trans. Instrum. Meas. (2005)
Keyphrases
- measurement noise
- measurement errors
- surface temperature
- noise level
- noisy data
- measurement error
- random noise
- noise reduction
- signal to noise ratio
- sparse matrix
- image noise
- additive noise
- noise sensitivity
- measured data
- data sets
- integrated circuit
- feature vectors
- multiscale
- noisy environments
- massively parallel
- gaussian noise
- wireless sensor networks