Generate High-Resolution Adversarial Samples by Identifying Effective Features.
Sizhe ChenPeidong ZhangChengjin SunJia CaiXiaolin HuangPublished in: CoRR (2020)
Keyphrases
- high resolution
- feature space
- low level
- classification accuracy
- sample points
- image processing
- field of view
- keypoints
- benchmark datasets
- co occurrence
- image features
- prior knowledge
- feature vectors
- high quality
- feature extraction
- decision trees
- high dimensional
- object recognition
- text classification
- class labels
- similarity measure
- high frequency
- high dimensionality
- magnetic resonance images