SIFT feature reduction based on feature similarity of repeated patterns.
Yoshihiro FujiwaraTakuya OkamotoKatsuya KondoPublished in: ISPACS (2013)
Keyphrases
- feature reduction
- repeated patterns
- feature set
- significant features
- image features
- rough sets
- text categorization
- similarity measure
- object recognition
- feature selection
- feature vectors
- texture segmentation
- feature extraction
- random forest
- linear discriminant analysis
- database systems
- multiresolution
- texture features
- natural language processing
- information extraction
- classification accuracy