The Coin Problem in Constant Depth: Sample Complexity and Parity gates.
Nutan LimayeKarteek SreenivasaiahSrikanth SrinivasanUtkarsh TripathiS. VenkiteshPublished in: Electron. Colloquium Comput. Complex. (2018)
Keyphrases
- sample complexity
- theoretical analysis
- upper bound
- learning problems
- vc dimension
- pac learning
- lower bound
- special case
- supervised learning
- active learning
- learning algorithm
- generalization error
- constant factor
- pac learnability
- training examples
- concept classes
- sample size
- linear threshold
- machine learning
- optimal solution
- concept class
- uniform convergence
- sample complexity bounds
- worst case
- objective function
- training data