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Trends and challenges of large scale embedded memories.

Tohru Furuyama
Published in: CICC (2004)
Keyphrases
  • real world
  • lessons learned
  • small scale
  • embedded systems
  • future trends
  • real life
  • multiscale
  • associative memory
  • key issues
  • database
  • real time
  • low cost
  • design principles
  • open issues
  • control software