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Characterization of Commercial High-Voltage p-GaN Gate Power HEMTs.

Kailun ZhongJin WeiJiabei HeSirui FengYuru WangSong YangKevin J. Chen
Published in: IEEE Trans. Ind. Electron. (2022)
Keyphrases
  • high voltage
  • operating conditions
  • power consumption
  • normal operation
  • partial discharge
  • cmos technology
  • neural network
  • image processing
  • multi class
  • decision makers
  • low power
  • field effect transistors