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Maximum likelihood estimator for jitter noise models [HF sampling scopes].

Gerd VandersteenRik Pintelon
Published in: IEEE Trans. Instrum. Meas. (2000)
Keyphrases
  • probabilistic model
  • maximum likelihood estimator
  • statistical model
  • high frequency
  • noise level
  • statistical models
  • bayesian framework
  • importance sampling