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The Statistical Failure Analysis for the Design of Robust SRAM in Nano-Scale Era.
Young-Gu Kim
Soo-Hwan Kim
Hoon Lim
Sanghoon Lee
Keun-Ho Lee
Young-Kwan Park
Moon-Hyun Yoo
Published in:
ISQED (2008)
Keyphrases
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statistical analysis
design process
nano scale
data analysis
user interface
image analysis
design methodology
design space
data mining
learning algorithm
knowledge base
case study
engineering design
correlation analysis
descriptive statistics