Analysing AWN-Specifications Using mCRL2 (Extended Abstract).

Rob J. van Glabbeek Peter Höfner Djurre van der Wal

Published in: IFM (2018)

Keyphrases

extended abstract
delay insensitive
formal specification
database systems
database
data mining
image segmentation
high level
reinforcement learning
data structure
probabilistic model
functional requirements
formal language