Login / Signup

A Comprehensive Multi-criteria Model for High Cartographic Quality Point-Feature Label Placement.

Maxim A. RylovAndreas W. Reimer
Published in: Cartogr. Int. J. Geogr. Inf. Geovisualization (2014)
Keyphrases
  • multi criteria
  • probabilistic model
  • computer vision
  • feature selection
  • database systems
  • pattern recognition
  • computational intelligence