Copper metallization influence on power MOS reliability.

Adeline Feybesse Ivana Deram Jean-Michel Reynes Eric Moreau

Published in: Microelectron. Reliab. (2003)

Keyphrases

power consumption
artificial intelligence
evolutionary algorithm
thin film
factors influencing
main factors
neural network
real world
data mining
machine learning
image processing
database systems
highly reliable
wind turbine
power distribution systems