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Automatic inspection system of LED chip using two-stages back-propagation neural network.

Chung-Feng Jeffrey KuoChien-Tung Max HsuZong-Xian LiuHan-Cheng Wu
Published in: J. Intell. Manuf. (2014)
Keyphrases
  • back propagation neural network
  • neural network
  • hybrid model
  • neural network model
  • support vector regression
  • printed circuit boards
  • artificial neural networks