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Accuracy of NDVI-derived corn yield predictions is impacted by time of sensing.

Ángel MaresmaLindsay ChamberlainAristotelis C. TagarakisTulsi KharelGreg GodwinKarl J. CzymmekElson ShieldsQuirine M. Ketterings
Published in: Comput. Electron. Agric. (2020)
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