Device and circuit-level performance comparison of GAA nanosheet FET with varied geometrical parameters.
N. Aruna KumariPothupogu PrithviPublished in: Microelectron. J. (2022)
Keyphrases
- field effect transistors
- higher level
- equivalent circuit
- maximum likelihood
- parameter estimation
- parameter values
- measurement data
- expectation maximization
- semiconductor devices
- sensitivity analysis
- chip design
- circuit design
- parameter selection
- transfer function
- input parameters
- operating conditions
- levels of abstraction
- genetic algorithm
- lower level
- statistical analysis
- input data