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An aging-aware model for the leakage power of nanoscaled digital integrated circuits in IoT era.

Amirhossein MoshrefiHossein AghababaOmid Shoaei
Published in: ICECS (2017)
Keyphrases
  • computational model
  • management system
  • integrated circuit
  • similarity measure
  • probabilistic model
  • statistical model
  • neural network
  • artificial neural networks
  • data management
  • formal model