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Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits.
Theodor Hillebrand
Nico Hellwege
Maike Taddiken
Konstantin Tscherkaschin
Steffen Paul
Dagmar Peters-Drolshagen
Published in:
MIXDES (2016)
Keyphrases
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significant improvement
dynamic programming
neural network
similarity measure
computational cost
preprocessing
probabilistic model
high accuracy
high speed
detection method
circuit design
evolutionary algorithm
cost function
clustering method
camera calibration