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Degradation testing and failure analysis of DC film capacitors under high humidity conditions.

Huai WangDennis A. NielsenFrede Blaabjerg
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • image analysis
  • quantitative analysis
  • databases
  • information systems
  • sufficient conditions
  • real world
  • genetic algorithm
  • image processing
  • wide range
  • hidden markov models
  • test set
  • high precision
  • video analysis