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Investigation of electromigration in micrometer-scale metal wires by in-situ optical microscopy.
Y. Kuwabara
S. Nishimura
R. Zaharuddin
J. Shirakashi
Published in:
NEMS (2011)
Keyphrases
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image analysis
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field effect transistors
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neural network
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power supply
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image sequences
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fluorescence microscopy