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Through-Silicon-Via Characterization and Modeling Using a Novel One-Port De-Embedding Technique.

An-Sam PengMing-Hsiang ChoYueh-Hua WangMeng-Fang WangDavid ChenLin-Kun Wu
Published in: IEICE Trans. Electron. (2013)
Keyphrases
  • high speed
  • vector space
  • image sequences
  • feature extraction
  • steady state