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Backside Die-Edge and Underfill Fillet Cracks Induced by Additional Tensile Stress from Increasing Die-to-Package Ratio in Bare-Die FCBGA.

Khai NguyenErnie OpinianoRandolph Mah
Published in: IRPS (2020)
Keyphrases
  • databases
  • real time
  • information retrieval
  • similarity measure
  • information technology
  • finite element