Wafer Yield Estimation Using Support Vector Machines.
Lei-Ting ChenDavid LinDan MuunizChia-Jiu WangPublished in: ISNN (2) (2006)
Keyphrases
- maximum likelihood estimation
- data mining
- monte carlo simulation
- parameter estimation
- artificial neural networks
- case study
- data structure
- relational databases
- e learning
- model selection
- information retrieval
- machine learning
- estimation algorithm
- databases
- massively parallel
- accurate estimation
- estimation accuracy
- estimation process
- semiconductor manufacturing
- learning to classify