Regressive Testing for System-on-Chip with Unknown-Good-Yield.

Noh-Jin Park Byoungjae Jin K. M. George Nohpill Park Minsu Choi

Published in: DFT (2003)

Keyphrases

hardware and software
wide range
power consumption
embedded systems
real time
information systems
neural network
data mining
artificial intelligence
case study
three dimensional
digital libraries
design methodology