Feedforward Neural Networks for Estimating IC Parametric Yield and Device Characterization.
Gregory L. CreechJacek M. ZuradaPeter B. AronhimePublished in: ISCAS (1995)
Keyphrases
- feedforward neural networks
- neural network
- error function
- recurrent neural networks
- back propagation
- hidden layer
- backpropagation algorithm
- hidden neurons
- extreme learning machine
- training algorithm
- activation function
- integrated circuit
- multi layer perceptron
- learning rate
- artificial neural networks
- multilayer perceptron
- feed forward
- decision making