Self-test method and recovery mechanism for high frequency TSV array.

Jia Zhang Le Yu Haigang Yang Y. L. Xie F. B. Zhou Wei Wang

Published in: VLSI-SoC (2011)

Keyphrases

high frequency
similarity measure
subband
low frequency
phase shifting
image processing
multiscale
image data
wavelet transform
image quality
wavelet decomposition
high frequency components