A data mining approach considering missing values for the optimization of semiconductor-manufacturing processes.

Doh-Soon Kwak Kwang-Jae Kim

Published in: Expert Syst. Appl. (2012)

Keyphrases

missing values
manufacturing processes
missing data
incomplete data
manufacturing systems
data imputation
missing data imputation
product quality
pattern recognition
high dimensional data
mathematical models
rapid prototyping
high dimensional
knowledge discovery
nearest neighbor
missing attribute values