Product Inspection Methodology via Deep Learning: An Overview.

Tae-Hyun Kim Hye-Rin Kim Yeong-Jun Cho

Published in: CoRR (2021)

Keyphrases

deep learning
unsupervised learning
unsupervised feature learning
machine learning
mental models
restricted boltzmann machine
weakly supervised
data sets
domain specific
learning algorithm
feature selection
object recognition