Machine Learning based Indicators to Enhance Process Monitoring by Pattern Recognition.
Stefan SchrunnerMichael ScheiberAnna JenulAnja ZernigAndre KästnerRoman KernPublished in: CoRR (2021)
Keyphrases
- pattern recognition
- machine learning
- computer vision
- feature selection
- machine learning methods
- learning algorithm
- information extraction
- neural network
- image analysis
- artificial intelligence
- inductive learning
- learning tasks
- machine learning algorithms
- support vector machine
- data sets
- pattern analysis
- field of pattern recognition
- active learning
- pattern recognition problems
- explanation based learning
- kernel methods
- image processing
- speech recognition
- learning systems
- signal processing
- computer science
- natural language
- support vector machine svm
- unsupervised learning
- e learning
- information systems
- data mining
- knowledge representation
- real time