On-Chip Delay Measurement Circuit for Reliability Characterization of SRAM.
Pankaj VermaRohit HalbaHemant PatelMaryam Shojaei BaghiniPublished in: ISVLSI (2016)
Keyphrases
- power dissipation
- power consumption
- cmos technology
- low power
- power reduction
- high speed
- phase locked loop
- chip design
- analog vlsi
- circuit design
- nm technology
- random access memory
- low voltage
- energy efficiency
- power management
- low cost
- data acquisition
- analog circuits
- neural network
- mixed signal
- network reliability
- real time
- evolvable hardware
- design methodology
- finite state machines
- parallel processing
- data center
- micron cmos