TSV Geometrical Variations and Optimization Metric with Repeaters for 3D IC.

Hung Viet Nguyen Myunghwan Ryu Youngmin Kim

Published in: IEICE Trans. Electron. (2012)

Keyphrases

optimization problems
optimization process
optimization algorithm
data mining
optimization method
discrete optimization
database
optimization procedure
constrained optimization
metric space
pairwise
artificial intelligence
real time
distance measure
metric learning
lower bound
integrated circuit
joint optimization